General Purpose Electronic Test Equipment Parts

End item NSN parts
Filter By: Digital Reado Electronic Counters
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Part Number
NSN
NIIN
000-8005-049 Digital Reado Electronic Counter
011653153
05340-90011 Digital Reado Electronic Counter
011225602
05340-90021 Digital Reado Electronic Counter
011225602
14061298-7 Digital Reado Electronic Counter
010491844
1531AB Digital Reado Electronic Counter
009116368
1900A Digital Reado Electronic Counter
010491844
1992 Digital Reado Electronic Counter
012553189
1992-55.04E Digital Reado Electronic Counter
012553189
1992-ETI-04E-55 Digital Reado Electronic Counter
012553189
28480-5340A001 Digital Reado Electronic Counter
011225602
426-4903 Digital Reado Electronic Counter
005314752
430-8285 Digital Reado Electronic Counter
010491844
5327B Digital Reado Electronic Counter
010188654
5328A-021 Digital Reado Electronic Counter
011349995
5328A-C96 Digital Reado Electronic Counter
010390086
5328A-H99 Digital Reado Electronic Counter
011349994
5328AC96 Digital Reado Electronic Counter
010390086
5328AF-H99 Digital Reado Electronic Counter
010390086
5328AF/096 Digital Reado Electronic Counter
010390086
5328B-010-021-03 Digital Reado Electronic Counter
012519861
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General Purpose Electronic Test Equipment

Picture of General Purpose Electronic Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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